Cita APA

Valdivieso, C., Crespo Yepes, A., Miranda, R., Bernal, D., Martin Martinez, J., Rodríguez Martínez, R., & Nafria, M. (2023). Impact of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs.

Citación estilo Chicago

Valdivieso, Carlos|||0000-0002-4259-931X, Albert|||0000-0003-4618-651X Crespo Yepes, R. Miranda, D. Bernal, Javier|||0000-0001-5938-5898 Martin Martinez, Rosana|||0000-0002-4565-6703 Rodríguez Martínez, y Montserrat|||0000-0002-9549-2890 Nafria. Impact of OFF-State, HCI and BTI Degradation in FDSOI Ω-gate NW-FETs. 2023.

Cita MLA

Valdivieso, Carlos|||0000-0002-4259-931X, et al. Impact of OFF-State, HCI and BTI Degradation in FDSOI Ω-gate NW-FETs. 2023.