Cita APA

Arilla, R., Barrena, E., Ocal, C., & Martín-Jiménez, D. (2025). Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films.

Citación estilo Chicago

Arilla, Rodrigo, Esther Barrena, Carmen Ocal, y Daniel Martín-Jiménez. Bimodal Atomic Force Microscopy With a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films. 2025.

Cita MLA

Arilla, Rodrigo, Esther Barrena, Carmen Ocal, y Daniel Martín-Jiménez. Bimodal Atomic Force Microscopy With a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films. 2025.