Martín Malpartida, G. (2018). Combined Transmission Electron Microscopy and In-Situ Scanning Tunneling Microscopy Characterization of Nanomaterials.
Chicago Style CitationMartín Malpartida, Gemma. Combined Transmission Electron Microscopy and In-Situ Scanning Tunneling Microscopy Characterization of Nanomaterials. 2018.
MLA CitationMartín Malpartida, Gemma. Combined Transmission Electron Microscopy and In-Situ Scanning Tunneling Microscopy Characterization of Nanomaterials. 2018.
Warning: These citations may not always be 100% accurate.