Swoboda, T., Gao, X., Rosário, C., Hui, F., Zhu, K., Yuan, Y., . . . Muñoz Rojo, M. (2023). Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO2 Resistive Random Access Memories to Address Device Variability.
Citación estilo ChicagoSwoboda, T., et al. Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO2 Resistive Random Access Memories to Address Device Variability. 2023.
Cita MLASwoboda, T., et al. Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO2 Resistive Random Access Memories to Address Device Variability. 2023.
Precaución: Estas citas no son 100% exactas.