Martil De La Plaza, I., González Díaz, G., Prado Millán, Á. D., & San Andrés Serrano, E. (2001). Electrical properties of rapid thermally annealed SiNx: H/Si structures characterized by capacitance-voltage and surface photovoltage spectroscopy.
Citação norma ChicagoMartil De La Plaza, Ignacio, Germán González Díaz, Álvaro Del Prado Millán, e Enrique San Andrés Serrano. Electrical Properties of Rapid Thermally Annealed SiNx: H/Si Structures Characterized By Capacitance-voltage and Surface Photovoltage Spectroscopy. 2001.
Citação norma MLAMartil De La Plaza, Ignacio, Germán González Díaz, Álvaro Del Prado Millán, e Enrique San Andrés Serrano. Electrical Properties of Rapid Thermally Annealed SiNx: H/Si Structures Characterized By Capacitance-voltage and Surface Photovoltage Spectroscopy. 2001.