Cita APA

Rodríguez Montañés, R., Arumi Delgado, D., Figueras Pàmies, J., Beverloo, W., Vries, D. K. d., Eichenberger, S., & Volf, P. A. J. (2010). Localization and electrical characterization of interconnect open defects.

Citación estilo Chicago

Rodríguez Montañés, Rosa|||0000-0001-6231-0862, Daniel|||0000-0002-6638-7485 Arumi Delgado, Joan Figueras Pàmies, Willem Beverloo, Dirk K. de Vries, Stefan Eichenberger, y Paul A. J. Volf. Localization and Electrical Characterization of Interconnect Open Defects. 2010.

Cita MLA

Rodríguez Montañés, Rosa|||0000-0001-6231-0862, et al. Localization and Electrical Characterization of Interconnect Open Defects. 2010.