Cita APA

Salvador, E., Gonzalez Bargallo, M., Campabadal, F., Martin-Martinez, J., Rodriguez, R. P., & Miranda, E. A. (2023). Assessment of the variability of the I-V characteristic of HfO<inf>2</inf>-based resistive switching devices and its simulation using the quasi-static memdiode model.

Citación estilo Chicago

Salvador, E., Mireia Gonzalez Bargallo, Francesca Campabadal, Javier Martin-Martinez, Rosana Paula Rodriguez, y Enrique A. Miranda. Assessment of the Variability of the I-V Characteristic of HfO<inf>2</inf>-based Resistive Switching Devices and Its Simulation Using the Quasi-static Memdiode Model. 2023.

Cita MLA

Salvador, E., et al. Assessment of the Variability of the I-V Characteristic of HfO<inf>2</inf>-based Resistive Switching Devices and Its Simulation Using the Quasi-static Memdiode Model. 2023.