Cita APA

Zaldivar, M., Fernández Sánchez, P., & Piqueras De Noriega, F. J. (2001). Study of growth hillocks in GaN: Si films by electron beam induced current imaging.

Citación estilo Chicago

Zaldivar, M.H., Paloma Fernández Sánchez, y Francisco Javier Piqueras De Noriega. Study of Growth Hillocks in GaN: Si Films By Electron Beam Induced Current Imaging. 2001.

Cita MLA

Zaldivar, M.H., Paloma Fernández Sánchez, y Francisco Javier Piqueras De Noriega. Study of Growth Hillocks in GaN: Si Films By Electron Beam Induced Current Imaging. 2001.