Maestro Izquierdo, M., Diaz-Fortuny, J., Crespo Yepes, A., Bargallo Gonzalez, M., Martin Martinez, J., Rodríguez Martínez, R., . . . Aymerich Humet, X. (2016). New high resolution random telegraph noise (RTN) characterization method for resistive RAM.

Maestro Izquierdo, Marcos|||0000-0002-8940-9050, Javier|||0000-0002-8186-071X Diaz-Fortuny, Albert|||0000-0003-4618-651X Crespo Yepes, Mireia|||0000-0001-6792-4556 Bargallo Gonzalez, Javier|||0000-0001-5938-5898 Martin Martinez, Rosana|||0000-0002-4565-6703 Rodríguez Martínez, Montserrat|||0000-0002-9549-2890 Nafria, Francesca|||0000-0001-7758-4567 Campabadal, and Xavier|||0000-0002-5874-6257 Aymerich Humet. New High Resolution Random Telegraph Noise (RTN) Characterization Method for Resistive RAM. 2016.

Maestro Izquierdo, Marcos|||0000-0002-8940-9050, et al. New High Resolution Random Telegraph Noise (RTN) Characterization Method for Resistive RAM. 2016.