Long, X., Tan, H., Sánchez Barrera, F., Fina, I., & Fontcuberta, J. (2023). Ferroelectric Electroresistance after a Breakdown in Epitaxial Hf0.5Zr0.5O2 Tunnel Junctions.
Citación estilo ChicagoLong, Xiao, Huan Tan, Florencio Sánchez Barrera, Ignasi Fina, y Josep Fontcuberta. Ferroelectric Electroresistance After a Breakdown in Epitaxial Hf0.5Zr0.5O2 Tunnel Junctions. 2023.
Cita MLALong, Xiao, et al. Ferroelectric Electroresistance After a Breakdown in Epitaxial Hf0.5Zr0.5O2 Tunnel Junctions. 2023.
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