Cita APA

Hiller, D., López Vidrier, J., Gutsch, S., Zacharias, M., Wahl, M., Bock, W., . . . König, D. (2017). Boron-incorporating silicon nanocrystals embedded in SiO2: Absende of free carriers vs. B-induced defects.

Citación estilo Chicago

Hiller, Daniel, et al. Boron-incorporating Silicon Nanocrystals Embedded in SiO2: Absende of Free Carriers Vs. B-induced Defects. 2017.

Cita MLA

Hiller, Daniel, et al. Boron-incorporating Silicon Nanocrystals Embedded in SiO2: Absende of Free Carriers Vs. B-induced Defects. 2017.