Beltrán, V., Weber, B., Lillo, R., Manzanares Céspedes, M. C., Sanzana, C., Fuentes, N., . . . Valdivia Gandur, I. (2020). Histomorphometric analysis of osseointegrated grade V titanium mini transitional implants inEdentulous mandible by backscattered scanning electron microscopy (BS-SEM).
Citación estilo ChicagoBeltrán, Víctor, Benjamín Weber, Ricardo Lillo, María Cristina Manzanares Céspedes, Cristina Sanzana, Nicolás Fuentes, Pablo Acuña-Mardones, y Ivan Valdivia Gandur. Histomorphometric Analysis of Osseointegrated Grade V Titanium Mini Transitional Implants InEdentulous Mandible By Backscattered Scanning Electron Microscopy (BS-SEM). 2020.
Cita MLABeltrán, Víctor, et al. Histomorphometric Analysis of Osseointegrated Grade V Titanium Mini Transitional Implants InEdentulous Mandible By Backscattered Scanning Electron Microscopy (BS-SEM). 2020.