Fernández-García, M., Gallrapp, C., Moll, M., & Muenstermann, D. (2016). Radiation hardness studies of neutron irradiated CMOS sensors fabricated in the ams H18 high voltage process.
Citación estilo ChicagoFernández-García, Marcos, Christian Gallrapp, Michael Moll, y D. Muenstermann. Radiation Hardness Studies of Neutron Irradiated CMOS Sensors Fabricated in the Ams H18 High Voltage Process. 2016.
Cita MLAFernández-García, Marcos, Christian Gallrapp, Michael Moll, y D. Muenstermann. Radiation Hardness Studies of Neutron Irradiated CMOS Sensors Fabricated in the Ams H18 High Voltage Process. 2016.
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