Dadgostar, S., Souto Bartolomé, J. M., & Jiménez López, J. I. (2021). CL as a tool for device characterisation: The case of laser diode degradation.
Chicago Style CitationDadgostar, Shabnam, Jorge Manuel Souto Bartolomé, and Juan Ignacio Jiménez López. CL As a Tool for Device Characterisation: The Case of Laser Diode Degradation. 2021.
MLA CitationDadgostar, Shabnam, Jorge Manuel Souto Bartolomé, and Juan Ignacio Jiménez López. CL As a Tool for Device Characterisation: The Case of Laser Diode Degradation. 2021.
Warning: These citations may not always be 100% accurate.