Cita APA

Roca i Cabarrocas, P. (., Hamma, S., Hadjadj, A., Bertomeu i Balagueró, J., & Andreu i Batallé, J. (1996). New features of the layer-by-layer deposition of microcrystalline silicon films revealed by spectroscopic ellipsometry and high resolution transmission electron microscopy.

Citación estilo Chicago

Roca i Cabarrocas, P. (Pere), S. Hamma, A. Hadjadj, Joan Bertomeu i Balagueró, y Jordi Andreu i Batallé. New Features of the Layer-by-layer Deposition of Microcrystalline Silicon Films Revealed By Spectroscopic Ellipsometry and High Resolution Transmission Electron Microscopy. 1996.

Cita MLA

Roca i Cabarrocas, P. (Pere), et al. New Features of the Layer-by-layer Deposition of Microcrystalline Silicon Films Revealed By Spectroscopic Ellipsometry and High Resolution Transmission Electron Microscopy. 1996.