Cita APA

Feijoo, P. C., Kauerauf, T., Toledano-Luque, M., Togo, M., San Andrés Serrano, E., & Groeseneken, G. (2012). Time-dependent dielectric breakdown on subnanometer EOT nMOS FinFETs.

Citación estilo Chicago

Feijoo, Pedro Carlos, Thomas Kauerauf, María Toledano-Luque, Misuhiro Togo, Enrique San Andrés Serrano, y Guido Groeseneken. Time-dependent Dielectric Breakdown On Subnanometer EOT NMOS FinFETs. 2012.

Cita MLA

Feijoo, Pedro Carlos, et al. Time-dependent Dielectric Breakdown On Subnanometer EOT NMOS FinFETs. 2012.