Martil De La Plaza, I., González Díaz, G., Prado Millán, Á. D., & San Andrés Serrano, E. (2003). Optical and structural properties of SiOxNyHz films deposited by electron cyclotron resonance and their correlation with composition.
Citación estilo ChicagoMartil De La Plaza, Ignacio, Germán González Díaz, Álvaro Del Prado Millán, y Enrique San Andrés Serrano. Optical and Structural Properties of SiOxNyHz Films Deposited By Electron Cyclotron Resonance and Their Correlation With Composition. 2003.
Cita MLAMartil De La Plaza, Ignacio, Germán González Díaz, Álvaro Del Prado Millán, y Enrique San Andrés Serrano. Optical and Structural Properties of SiOxNyHz Films Deposited By Electron Cyclotron Resonance and Their Correlation With Composition. 2003.