Experimental Study of the Multipactor Effect in a Partially Dielectric-Loaded Rectangular Waveguide
This letter presents the experimental study of the multipactor threshold in a partially dielectric-loaded rectangular waveguide, whose results validate a multipactor model recently developed by the authors, which includes the charge distribution appearing on the dielectric surface during the multipa...
| Autores: | , , , , |
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| Tipo de documento: | artigo |
| Data de publicação: | 2019 |
| País: | España |
| Recursos: | Universidad Miguel Hernández de Elche |
| Repositório: | REDIUMH. Depósito Digital de la UMH |
| OAI Identifier: | oai:dspace.umh.es:11000/5653 |
| Acesso em linha: | http://hdl.handle.net/11000/5653 |
| Access Level: | Acceso aberto |
| Palavra-chave: | Multipactor effect RF breakdown dielectric rectangular waveguide waveguide transformer Secondary Electron Yield (SEY) 621.3 - Ingeniería eléctrica. Electrotecnia. Telecomunicaciones |
| Resumo: | This letter presents the experimental study of the multipactor threshold in a partially dielectric-loaded rectangular waveguide, whose results validate a multipactor model recently developed by the authors, which includes the charge distribution appearing on the dielectric surface during the multipactor discharge. First, the variation of the multipactor RF voltage threshold has been theoretically analyzed in different waveguide configurations: in an empty waveguide, and also in the cases of a one-sided and two-sided dielectric-loaded waveguides. To reach this aim, an in-house Monte Carlo simulation tool has been developed. The Secondary Electron Yield (SEY) of the metallic and dielectric materials used in the numerical simulations have been measured experimentally. Finally, an aluminum WR-75 symmetric E-plane rectangular waveguide transformer has been designed and fabricated, in which several multipaction tests have been carried out to validate the in-house software tool, demonstrating an excellent agreement between the simulation results and the experimental data. |
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