Rapun Banzo, M. L., & Le Louer, F. (2017). Topological sensitivity for solving inverse multiple scattering problems in three-dimensional electromagnetism. Part I: One step method.
Citación estilo ChicagoRapun Banzo, Maria Luisa|||0000-0001-5787-5252, y Frederique Le Louer. Topological Sensitivity for Solving Inverse Multiple Scattering Problems in Three-dimensional Electromagnetism. Part I: One Step Method. 2017.
Cita MLARapun Banzo, Maria Luisa|||0000-0001-5787-5252, y Frederique Le Louer. Topological Sensitivity for Solving Inverse Multiple Scattering Problems in Three-dimensional Electromagnetism. Part I: One Step Method. 2017.
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