Cita APA

Breymesser, A., Schlosser, V., Peiró, D., Voz Sánchez, C., Bertomeu i Balagueró, J., Andreu i Batallé, J., & Summhammer, J. (2001). Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM.

Citación estilo Chicago

Breymesser, A., V. Schlosser, D. Peiró, Cristóbal Voz Sánchez, Joan Bertomeu i Balagueró, Jordi Andreu i Batallé, y J. Summhammer. Kelvin Probe Measurements of Microcrystalline Silicon On a Nanometer Scale Using SFM. 2001.

Cita MLA

Breymesser, A., et al. Kelvin Probe Measurements of Microcrystalline Silicon On a Nanometer Scale Using SFM. 2001.