Cita APA

Rodríguez Martínez, R., Martin Martinez, J., Crespo Yepes, A., Porti i Pujal, M., Nafria, M., & Aymerich Humet, X. (2012). Dielectric breakdown in ultra-thin Hf based gate stacks.

Citación estilo Chicago

Rodríguez Martínez, Rosana|||0000-0002-4565-6703, Javier|||0000-0001-5938-5898 Martin Martinez, Albert|||0000-0003-4618-651X Crespo Yepes, Marc|||0000-0001-7438-3823 Porti i Pujal, Montserrat|||0000-0002-9549-2890 Nafria, y Xavier|||0000-0002-5874-6257 Aymerich Humet. Dielectric Breakdown in Ultra-thin Hf Based Gate Stacks. 2012.

Cita MLA

Rodríguez Martínez, Rosana|||0000-0002-4565-6703, et al. Dielectric Breakdown in Ultra-thin Hf Based Gate Stacks. 2012.