Cita APA

Angervo, I., Antola, A., Vaimala, T., Malmi, A., Schulman, A., Huhtinen, H., & Paturi, P. (2024). Importance of growth method and substrate-induced crystalline quality in Al/Gd0.2Ca0.8MnO3/Au memristor devices.

Citación estilo Chicago

Angervo, Ilari, Anni Antola, T. Vaimala, A. Malmi, Alejandro Schulman, Hannu Huhtinen, y Petriina Paturi. Importance of Growth Method and Substrate-induced Crystalline Quality in Al/Gd0.2Ca0.8MnO3/Au Memristor Devices. 2024.

Cita MLA

Angervo, Ilari, et al. Importance of Growth Method and Substrate-induced Crystalline Quality in Al/Gd0.2Ca0.8MnO3/Au Memristor Devices. 2024.