Cruz,Yarens J., Castaño, F., Villalonga, A., Mishra, M., & Haber, R. E. (2025). A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based on Machine Learning and Synthetic Data Generation: A Review and Case Study on SiC MOSFETs.
Citación estilo ChicagoCruz,Yarens J., Fernando Castaño, Alberto Villalonga, Madhav Mishra, y Rodolfo E. Haber. A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based On Machine Learning and Synthetic Data Generation: A Review and Case Study On SiC MOSFETs. 2025.
Cita MLACruz,Yarens J., et al. A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based On Machine Learning and Synthetic Data Generation: A Review and Case Study On SiC MOSFETs. 2025.