Vidas, L., Günther, C. M., Miller, T. A., Pfau, B., Perez-Salinas, D., Martínez, E., . . . Wall, S. (2018). Imaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography.
Citación estilo ChicagoVidas, Luciana, et al. Imaging Nanometer Phase Coexistence At Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films By Resonant Soft X‑ray Holography. 2018.
Cita MLAVidas, Luciana, et al. Imaging Nanometer Phase Coexistence At Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films By Resonant Soft X‑ray Holography. 2018.
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