Acosta Mejía, J. C., Polesel, J., François, T., Xie, H., Haliyo, S., & Régnier, S. (2013). Gentle and fast atomic force microscopy with a piezoelectric scanning probe for nanorobotics applications.
Citación estilo ChicagoAcosta Mejía, Juan Camilo, Jerome Polesel, Thoyer François, Hui Xie, Sinan Haliyo, y Stéphane Régnier. Gentle and Fast Atomic Force Microscopy With a Piezoelectric Scanning Probe for Nanorobotics Applications. 2013.
Cita MLAAcosta Mejía, Juan Camilo, et al. Gentle and Fast Atomic Force Microscopy With a Piezoelectric Scanning Probe for Nanorobotics Applications. 2013.
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