Zanatta, A. R. (2008). Influence of film thickness on the crystallization of Ni-doped amorphous silicon samples.
Citación estilo ChicagoZanatta, Antonio Ricardo. Influence of Film Thickness On the Crystallization of Ni-doped Amorphous Silicon Samples. 2008.
Cita MLAZanatta, Antonio Ricardo. Influence of Film Thickness On the Crystallization of Ni-doped Amorphous Silicon Samples. 2008.
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