Cita APA

Copetti, T. S., Balen, T. R., Brum, E. L. d., Aquistapace, C. O., & Poehls, L. M. B. (2020). Comparing the impact of power supply voltage on CMOS-and FinFET-based SRAMs in the presence of resistive defects.

Citación estilo Chicago

Copetti, Thiago Santos, Tiago Roberto Balen, Eduardo Longo de Brum, Caroline Oliveira Aquistapace, y Leticia Maria Bolzani Poehls. Comparing the Impact of Power Supply Voltage On CMOS-and FinFET-based SRAMs in the Presence of Resistive Defects. 2020.

Cita MLA

Copetti, Thiago Santos, et al. Comparing the Impact of Power Supply Voltage On CMOS-and FinFET-based SRAMs in the Presence of Resistive Defects. 2020.